The symposium will take place on April 22-24 2024, in Tempe, AZ, USA.
The program includes keynotes, scientific paper presentations, short industrial application paper presentations, special sessions, and Innovative Practices sessions.
You are invited to participate and submit your contributions to VTS’24. The areas of interest include (but are not limited to) the following topics:
VTS Topics
Analog – Mixed-Signal – RF Test
ATPG & Compression
Silicon Debug
Automotive Test & Safety
Built-In Self-Test (BIST)
Defect & Current Based Test
Defect & Fault Tolerance
Delay & Performance Test
Design for Testability – Yield or Reliability
Pre-silicon Design Verification & Validation
Post-silicon Validation
Hardware Security
Embedded System & Board Test
Embedded Test Methods
Emerging Technologies Test and Reliability
Fault Modeling and Simulation
Low-Power IC Test
Machine Learning in Test – Yield and Reliability
Microsystems/MEMS/Sensors Test
Memory Test and Repair
2.5D – 3D & SiP Test
Yield Optimization
On-Line Test & Error Correction
Power & Thermal Issues in Test
System-on-Chip (SOC) Test
Test & Reliability of Biomedical Devices
Test & Reliability of High-Speed I/O
Test & Reliability of Machine Learning Systems
Test Quality & Reliability
Test Standards & Economics
Test Resource Partitioning
Transient & Soft Errors
FPGA Test